34th Annual IEEE Computer Software and Applications Conference


STA 2012: The 4th IEEE International Workshop on Software Test Automation

Schedule - Monday July 16

STA 2012: The 4th IEEE International Workshop on Software Test Automation
Chair: Rajesh Subramanyan
Location: Didim (3rd floor)

Keynote: Attack Surface Reduction through Software Testing
Tugkan Tuglular, Izmir Institute of Technology, Turkey

Session 2: Agile Software Testing
Chair: Selma Tekir
Location: Didim (3rd floor
Invited Talk: Asynchronous Software Testing
Robert Hierons
Strategies for Agile Software Testing Automation: An Industrial Experience
Eliane Collins, Arilo Dias-Neto, Vicente Lucena
Adaptive Agile Performance Modeling and Testing
Marek Stochel, Mariusz Wawrowski, James Waskiel

Session 3: Testing Mobile and Open Software
Chair: Marek Stochel
Location: Didim (3rd floor)

Model-based Conformance Testing of WS-BPEL Compositions
Afef Jmal Maâlej, Moez Krichen, Mohamed Jmaiel
A Conceptual Framework for Open Source Software Test Process
Tamer Abdou, Peter Grogono, Pankaj Kamthan

Session 4: Testing Large Systems
Chair:Rob Hierons
Location: Didim (3rd floor)

Invited Talk: Recent Advances in Test Automation
Ina Schieferdecker
Mining Data Chain Graph for Fault Localization
Bo Yang, Ji Wu, Chao Liu
Effects of Class Imbalance in Test Suites: An Empirical Study of Spectrum-Based Fault Localization
Gong Cheng, Zheng Zheng, Li Wei, Hao Peng

Goal of the Workshop

Test automation aims to reduce the cost and improve the effectiveness of software testing by using various techniques and methods. Other benefits are consistency and accuracy, reduction of overall test cycle time, risk mitigation of manual testing, and increase in overall product quality. Recording test activities as test scripts and playing the test scripts or record and playback are the common methods. More advanced methodologies include data-driven, keyword-driven and hybrid methods as well as framework-based methods. Among tool development, interoperability remains a major challenge.

Theme and Scope of the Workshop (Call-for-Papers)
 This year's theme of COMPSAC is "Trustworthy Software Systems for the Digital Society" Creating the digital society calls for all aspects of computing, software development, software systems engineering, and applications. To sustain it, however, trust in systems is of paramount importance, thus the need for trustworthy software systems. Foundations, methodologies, architectures, and mechanisms that support modeling, design, implementation, and evaluation of trustworthy software systems and applications are of great concern. Accordingly, submissions including applications and case studies in these areas will highly be appreciated.

Topics of interest include, but are not limited to, the following:

• Model Based Testing
• Test automation in the context of different software development lifecycle methodologies
• Support for testing methods
• Application in different domains
• Operation, maintenance and evolution of test tools and environments
• Experiments, empirical studies, experience reports, and case studies.
• Quantitative studies including cost vs. benefit studies.


April 8th, 2012 : Workshop paper submission
May 9th, 2012 : Workshop paper author notification
May 18th, 2012 : Camera-ready & author registration

Workshop Organizers

Rajesh Subramanyan
Siemens USA
E-mail: rajesh.subramanyan at siemens.com

Fevzi Belli
University of Paderborn;
E-mail: belli at upb.de

Program Committee: 

Arun Bahulkar, Tata Research (TRRDC), India
Xiaoying Bai, Tsinghua University, China
Christof Budnik, Siemens, USA
Feza Buzluca, Istanbul Technical University, Turkey
Arilo Claudio, Federal University of Amazonas, Brazil
Atilla Elci, Eastern Mediterranean University, North Cyprus
Jerry Gao, San Jose State University, USA
Juncao Li, Microsoft, USA
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Marek Stochel, Motorola Solutions, Poland
Guilherme Travassos, Federal University of Rio de Janerio (UFRJ), Brazil
Dragos Truscan, Ãbo Akademi University, Finland
Tugkan Tuglular, Izmir University, Turkey
Andreas Ulrich, Siemens Corporate Technology, Germany
Hüsnü Yenigün, Sabanci University, Turkey
Xiangyu Zhang, Purdue University, USA

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